An introduction to failures and faults in digital circuits. Other topics include: the modelling of various types of faults: single and multiple stuck-at-faults, delay faults and bridging faults, test generation techniques for combinational and sequential circuits, fault simulation algorithms, design for testability (DFT) and built-in-self-test (BIST). PREREQ: COSC 3426. (lec 3) cr 3
